Advanced x-ray optics with Si wafers and slumped glass

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00163008" target="_blank" >RIV/68407700:21230/09:00163008 - isvavai.cz</a>
Alternative codes found
RIV/67985815:_____/09:00337793 RIV/68407700:21340/09:00163008
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Advanced x-ray optics with Si wafers and slumped glass
Original language description
We report on the continuation of the development of test samples of astronomical x-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimizedparameters including viscosity and internal stress analyses, as well as investigation of mounting influences. Experiments with Si wafers focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
ISBN
978-0-8194-7727-9
ISSN
0277-786X
e-ISSN
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Number of pages
12
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham
Event location
San Diego, California
Event date
Aug 2, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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