Non-invasive Measurement of Complex Permittivity of Dielectric Substrates

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00182328" target="_blank" >RIV/68407700:21230/11:00182328 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Non-invasive Measurement of Complex Permittivity of Dielectric Substrates
Original language description
Complex permittivity measurements are important in microwave engineering, material processing, as well as biomedical applications. Recently, planar circuits, such as microstrip lines, coplanar waveguides, and strip lines have found their applications incomplex permittivity measurements. Planar structures, which are lightweight, compact and low cost, have been successfully applied to the determination of substrate permittivity, material moisture etc. Planar circuit measurements are classified into resonant methods (with high accuracy and sensitivity) and non-resonant methods (broadband measurements). When choosing the measurement method, we have to take into account the non-destructive form of measurement. Therefore the most appropriate method is a modified resonance method.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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