Electromagnetic Interference of Integrated Circuit Studied by Near-Filed Scan
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00187260" target="_blank" >RIV/68407700:21230/11:00187260 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Electromagnetic Interference of Integrated Circuit Studied by Near-Filed Scan
Original language description
Electromagnetic interferences generated by integrated circuit were investigated by surface scan. Field Gate Programmable Array was chosen for testing purpose, because this type of integrated circuit provides unique opportunity for integrated circuits electromagnetic compatibility testing allowing user to change its functionality without changing package parameters. The tested chip was programmed with several different designs and electromagnetic field above surface was measured and analyzed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
POSTER 2011 - 15th International Student Conference on Electrical Engineering
ISBN
978-80-01-04806-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
1-4
Publisher name
ČVUT, Fakulta elektrotechnická
Place of publication
Praha
Event location
Prague
Event date
May 12, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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