Fast Near-Field Characterization of Integrated Circuits Electromagnetic Interference
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00180310" target="_blank" >RIV/68407700:21230/11:00180310 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Fast Near-Field Characterization of Integrated Circuits Electromagnetic Interference
Original language description
This paper describes method for speed improvement of electromagnetic near-filed scanning. Using the technique described in this paper both high spatial resolution and high speed of measurement can be achieved. Some applications of near-field scanning arepresented and discussed. Near-field scan technique is used for measurement of magnetic field distribution above a passive structure and for analysis of electromagnetic emission of integrated circuit operating in different regimes. Results show good reliability of presented method and its effectiveness for investigation of electromagnetic interference in integrated structures.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of 21st International Conference Radioelektronika 2011
ISBN
978-1-61284-322-3
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
311-314
Publisher name
VUT v Brně, FEKT, Ústav radioelektroniky
Place of publication
Brno
Event location
Brno
Event date
Apr 19, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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