ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00187518" target="_blank" >RIV/68407700:21230/11:00187518 - isvavai.cz</a>
Result on the web
<a href="http://www.nanocon.cz" target="_blank" >http://www.nanocon.cz</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE
Original language description
We present our results of the atomic force microscope (AFM) surface analysis of graphene layers prepared by different methods. We compared surfaces of exfoliated graphene, graphene grown CVD on copper foil and graphene prepared by high temperature annealing of SiC. The CVD grown graphene layers were characterized electrically. We measured the sheet resistance of the layers in the presence of gate voltage applied on the bottom electrode realized by the conducting silicon substrate isolated by the siliconoxide layer.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP108%2F11%2F0894" target="_blank" >GAP108/11/0894: Growth and processing of graphene layers on silicon carbide</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
NANOCON 2011 Conference Proceedings
ISBN
978-80-87294-23-9
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
481-485
Publisher name
TANGER, spol.s r.o.
Place of publication
Ostrava
Event location
Brno
Event date
Sep 21, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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