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Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F20%3APU138226" target="_blank" >RIV/00216305:26620/20:PU138226 - isvavai.cz</a>

  • Alternative codes found

    RIV/68081731:_____/20:00525529

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S0368204818302068" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0368204818302068</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.elspec.2019.06.005" target="_blank" >10.1016/j.elspec.2019.06.005</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

  • Original language description

    Two-dimensional materials, such as graphene, are usually prepared by chemical vapor deposition (CVD) on selected substrates, and their transfer is completed with a supporting layer, mostly polymethyl methacrylate (PMMA). Indeed, the PMMA has to be removed precisely to obtain the predicted superior properties of graphene after the transfer process. We demonstrate a new and effective technique to achieve a polymer-free CVD graphene - by utilizing low-energy electron irradiation in a scanning low-energy electron microscope (SLEEM). The influence of electron-landing energy on cleaning efficiency and graphene quality was observed by SLEEM, Raman spectroscopy (the presence of disorder D peak) and XPS (the deconvolution of the C 1s peak). After removing the absorbed molecules and polymer residues from the graphene surface with slow electrons, the individual graphene layers can also be distinguished outside ultra-high vacuum conditions in both the reflected and transmitted modes of a scanning low-energy (transmission) electron microscope.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

  • ISSN

    0368-2048

  • e-ISSN

    1873-2526

  • Volume of the periodical

    241

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    7

  • Pages from-to

    1-7

  • UT code for WoS article

    000540723700016

  • EID of the result in the Scopus database

    2-s2.0-85069968563