Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00525529" target="_blank" >RIV/68081731:_____/20:00525529 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26620/20:PU138226
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0368204818302068" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0368204818302068</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.elspec.2019.06.005" target="_blank" >10.1016/j.elspec.2019.06.005</a>

Result language
angličtina
Original language name
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
Original language description
Two-dimensional materials, such as graphene, are usually prepared by chemical vapor deposition (CVD) on selected substrates, and their transfer is completed with a supporting layer, mostly polymethyl methacrylate (PMMA). Indeed, the PMMA has to be removed precisely to obtain the predicted superior properties of graphene after the transfer process. We demonstrate a new and effective technique to achieve a polymer-free CVD graphene by utilizing low-energy electron irradiation in a scanning low-energy electron microscope (SLEEM). The influence of electron-landing energy on cleaning efficiency and graphene quality was observed by SLEEM, Raman spectroscopy (the presence of disorder D peak) and XPS (the deconvolution of the C 1s peak). After removing the absorbed molecules and polymer residues from the graphene surface with slow electrons, the individual graphene layers can also be distinguished outside ultra-high vacuum conditions in both the reflected and transmitted modes of a scanning low-energy (transmission) electron microscope.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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