Examination of Graphene in a Scanning Low Energy Electron Microscope

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450818" target="_blank" >RIV/68081731:_____/15:00450818 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >http://dx.doi.org/10.1017/S143192761500094X</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >10.1017/S143192761500094X</a>

Result language

angličtina

Original language name

Examination of Graphene in a Scanning Low Energy Electron Microscope

Original language description

Although graphene has been available and intensively studied for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and tocount the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. The freestanding graphene samples were first examined in the standard vacuum high resolutionSLEEM. Fig. 1 shows micrographs taken in the reflected electron (RE) as well as transmitted electron (TE) mode at several energies. The RE signal was composed of both secondary and backscattered electron emission, accelerated in the catho

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Volume of the periodical

21

Issue of the periodical within the volume

S3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

29-30

UT code for WoS article

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EID of the result in the Scopus database

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