Study of multi-layered graphene by ultra-low energy SEM/STEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00459573" target="_blank" >RIV/68081731:_____/16:00459573 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.diamond.2015.12.012" target="_blank" >http://dx.doi.org/10.1016/j.diamond.2015.12.012</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.diamond.2015.12.012" target="_blank" >10.1016/j.diamond.2015.12.012</a>
Alternative languages
Result language
angličtina
Original language name
Study of multi-layered graphene by ultra-low energy SEM/STEM
Original language description
Scanning electron microscopy with very slow electrons offers a novel tool enabling one to image the graphene samples at nanometer or even sub-nanometer lateral resolution in transmitted as well as reflected electrons and to count reliably the atomic layers in both imaging modes. The study was performed on graphene prepared by chemical vapor deposition on thin copper foil. Observation by slow electrons has also confirmed the underlayer mechanism of nucleation and growth bellow already existing graphene layers on copper. Moreover, electrons with impacted energy below 100 eV can be used for "cleaning" of a material. It leads to elimination of the contamination process during the measurement, which enables to observe the predicted oscillations in reflection mode and to measure the transmissivity of various stacks of layers in transmission mode down to units of eV.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Diamond and Related Materials
ISSN
0925-9635
e-ISSN
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Volume of the periodical
63
Issue of the periodical within the volume
March 2016
Country of publishing house
CH - SWITZERLAND
Number of pages
7
Pages from-to
136-142
UT code for WoS article
000371942700025
EID of the result in the Scopus database
2-s2.0-84959251388