Examination of Graphene with Very Slow Electrons

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00437839" target="_blank" >RIV/68081731:_____/14:00437839 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Examination of Graphene with Very Slow Electrons
Original language description
Although graphene has been available and intensively studied for nearly a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2Dcrystals should be easier to perform. Scanning electron microscopy with slow and very slow electrons offers an innovative tool enabling one to see graphene samples at nanometer or even sub-nanometer lateral resolution in both transmitted and reflected electrons and to count the number of layers reliably in both imaging modes. Diagnostics can be performed in this way on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. Moreover, bombardment with very slow electrons acts as an ultimate cleaning procedure removing adsorbed gases from crystal surfaces which can be monitored in scanned transmission electron images taken at below 50 eV.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
NANOCON 2014. 6th International conference proceedings
ISBN
978-80-87294-55-0
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
TANGER
Place of publication
Ostrava
Event location
Brno
Event date
Nov 5, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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