A method of imaging ultrathin foils with very low energy electrons

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00383741" target="_blank" >RIV/68081731:_____/12:00383741 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.ultramic.2012.01.002" target="_blank" >http://dx.doi.org/10.1016/j.ultramic.2012.01.002</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2012.01.002" target="_blank" >10.1016/j.ultramic.2012.01.002</a>

Result language
angličtina
Original language name
A method of imaging ultrathin foils with very low energy electrons
Original language description
We demonstrate the possibility to examine the free-standing foils of thicknesses in units of nm in the scanning low energy electron microscope, using both reflected and transmitted electrons. Very high contrast has been obtained in dependence on the thickness and structure of the foil. A contribution of secondary electrons to the forward scattered electron signal is discussed and a way of suppressing it is presented. Examples of reflected, total transmitted and dark field transmitted electron signal fortwo graphene-like samples are shown. Dependence of the transmitted signal on the electron energy is observed.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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