Differential Evolutionary Optimization Algorithm Applied to ESD MOSFET Model Fitting Problem
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00197296" target="_blank" >RIV/68407700:21230/12:00197296 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6219043" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6219043</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DDECS.2012.6219043" target="_blank" >10.1109/DDECS.2012.6219043</a>
Alternative languages
Result language
angličtina
Original language name
Differential Evolutionary Optimization Algorithm Applied to ESD MOSFET Model Fitting Problem
Original language description
The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the appropriate Electrostatic discharge (ESD) model to the measured data from a test chip without the need of manual model-parameter tuning, which presents very time and resource-consuming process. In this paper, the optimization procedure and the results of fitting the generic process NMOST model to the piece-wise linear I-V characteristic are presented.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F09%2F1601" target="_blank" >GA102/09/1601: Intelligent micro and nano structures for microsensors realized with support of nanotechnology</a><br>
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
ISBN
978-1-4673-1185-4
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
155-158
Publisher name
IEEE Computer Society Press
Place of publication
New York
Event location
Tallinn
Event date
Apr 18, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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