"Burying" of channel optical waveguides - relation between near-field measurement and Ag concentration profile

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F14%3A00225020" target="_blank" >RIV/68407700:21230/14:00225020 - isvavai.cz</a>
Alternative codes found
RIV/60461373:22310/15:43900797
Result on the web
<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >http://dx.doi.org/10.1117/12.2070307</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2070307" target="_blank" >10.1117/12.2070307</a>

Result language
angličtina
Original language name
"Burying" of channel optical waveguides - relation between near-field measurement and Ag concentration profile
Original language description
Two-step field-assisted ion-exchanged waveguides have been fabricated on a glass substrate. The concentration profiles of the exchanged ions were measured with electron microprobe. The waveguides were characterized under scanning electron microscope and optical microscope for the investigation of burying structures. Guiding mode patterns were characterized with near-field measurement, where symmetric profiles were observed for the burying-type waveguide. The refractive index profiles were also measured with a modified end-fire coupling method. The relation between ion concentration profiles and index profiles were compared for the waveguides with different fabrication process.
Czech name
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Czech description
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Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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