Burying of channel optical waveguides: relation between near- field measurement and Ag concentration profile

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F14%3A00222245" target="_blank" >RIV/68407700:21230/14:00222245 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Burying of channel optical waveguides: relation between near- field measurement and Ag concentration profile

Original language description

The aim of this work was to investigate the Ag+ - Na+ ion exchange as well as the subsequent electric field assisted ?burying? in newly designed silicate glasses. We especially focused on the relationship between Ag concentration profile in the channel waveguide and refractive index profile. The ion-exchanged samples were characterized using electron microprobe analysis. Furthermore, the refractive index profiles of the two-step ion-exchanged waveguides were characterized with a near-field measurement,and the profiles were compared with the concentration profiles. Newly, we studied the relation between properties in particular channel waveguides loss and silver concentration profiles.

Czech name

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Czech description

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Type

O - Miscellaneous

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2014

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů