Problem with no-clean flux spattering on in-circuit testing pads diagnosed by EDS analysis
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F16%3A00233980" target="_blank" >RIV/68407700:21230/16:00233980 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.microrel.2015.10.020" target="_blank" >http://dx.doi.org/10.1016/j.microrel.2015.10.020</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.microrel.2015.10.020" target="_blank" >10.1016/j.microrel.2015.10.020</a>
Alternative languages
Result language
angličtina
Original language name
Problem with no-clean flux spattering on in-circuit testing pads diagnosed by EDS analysis
Original language description
Surface Mount Technology (SMT) assembly often faces the issue of residues on In Circuit Testing (ICT) pads. These residues may have non-conductive character and therefore in-circuit test may mark tested product as failed though they would have worked normally. Since it is not possible to export such marked products, the total production quality decreases. In this work, we analyze the real manufacturing problem using Energy Dispersive Spectroscopy (EDS) analysis of the stains with the aim to find the possible source of residues that appear on the testing pads during the mass electronic assembly or during Printed Circuit Board (PCB) production. Analysis of potential source of residues together with its diagnostic and confirmation of its source is presented in this work.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Reliability
ISSN
0026-2714
e-ISSN
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Volume of the periodical
56
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
8
Pages from-to
162-169
UT code for WoS article
000369450200025
EID of the result in the Scopus database
2-s2.0-84954072008