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Flux effect on void quantity and size in soldered joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F16%3A00301367" target="_blank" >RIV/68407700:21230/16:00301367 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26220/16:PU122004

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.microrel.2016.03.009" target="_blank" >http://dx.doi.org/10.1016/j.microrel.2016.03.009</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.microrel.2016.03.009" target="_blank" >10.1016/j.microrel.2016.03.009</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Flux effect on void quantity and size in soldered joints

  • Original language description

    This article is focused on both macro and microvoids in soldered joints and the use of additional flux to reduce their frequency and minimize their negative effect on the soldered joint reliability. In total five fluxes were used, three were gel based (NC559, MTV-125R, TSF-6516) and two of them were liquid based (Topnik G-5, JBC FL-15). They were used within two solder pastes, both lead and lead-free. The reflow process was identical for all of the combinations and was within the range of manufacturer recommended profiles. The amount of voids was evaluated using X-ray analysis. It was found that the use of increased amount of proper flux, specifically flux with higher activity, in the solder paste may significantly lower the void occurrence.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronics Reliability

  • ISSN

    0026-2714

  • e-ISSN

  • Volume of the periodical

    60

  • Issue of the periodical within the volume

    5

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    135-140

  • UT code for WoS article

    000375516200019

  • EID of the result in the Scopus database

    2-s2.0-84977914382