Phase estimation of illumination pattern in structured illumination microscopy

Result code in IS VaVaI

RIV/68407700:21230/17:00312003 - isvavai.cz

Result on the web

http://ieeexplore.ieee.org/document/7937590/

DOI - Digital Object Identifier

10.1109/RADIOELEK.2017.7937590

Result language

angličtina

Original language name

Phase estimation of illumination pattern in structured illumination microscopy

Original language description

Conventional structured illumination microscopy (SIM) methods require precise knowledge of the illumination pattern and assume the sample to be stationary during the acquisition. Fulfilling these two conditions in practice is difficult. Therefore, the estimation of illumination pattern from acquired images is necessary. Inaccurate estimation of spatial frequency, angular orientation or phase shift of the illumination pattern leads to unwanted image reconstruction artifacts. In this paper, we analyze the performance of different phase estimation approaches using simulated SIM data from a synthetic sample.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

20201 - Electrical and electronic engineering

Project

GA17-05840S: Multicriteria Optimization of Shift-Variant Imaging System Models

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

2017 27th International Conference Radioelektronika (RADIOELEKTRONIKA)

ISBN

978-1-5090-4591-4

ISSN

—

e-ISSN

—

Number of pages

4

Pages from-to

174-177

Publisher name

VUT v Brně, FEKT, Ústav radioelektroniky

Place of publication

Brno

Event location

Brno

Event date

Apr 19, 2017

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

000414280400032