Analysis of image reconstruction artifacts in structured illumination microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00313935" target="_blank" >RIV/68407700:21230/17:00313935 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1117/12.2274418" target="_blank" >http://dx.doi.org/10.1117/12.2274418</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2274418" target="_blank" >10.1117/12.2274418</a>

Result language

angličtina

Original language name

Analysis of image reconstruction artifacts in structured illumination microscopy

Original language description

Structured Illumination Microscopy (SIM) is a super-resolution technique which enables to enhance the resolution of optical microscopes beyond the diraction limit. The nal super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require precise knowledge of the illumination pattern and assume the sample to be stationary during the acquisition of illumination patterned images. In the case of imaging live cells, the movements of the cell result in the occurrence of image reconstruction artifacts. To reduce this kind of artifacts the short acquisition time is needed. However, short exposure time causes low signal-to-noise ratio (SNR). Moreover, a drift of the specimen may distort the illumination pattern properties in each image. This issue together with the low SNR makes the estimation of reconstruction parameters a challenging task. Inaccurate assessment of spatial frequency, phase shift or orientation of the illumination pattern leads to incorrect separation and shift of spectral components in Fourier space. This results in unwanted image reconstruction artifacts and hampers the resolution enhancement in practice. In this paper, we analyze possible artifacts in super-resolution images reconstructed using super-resolution SIM technique (SR-SIM). An overview of typical image reconstruction artifact types is presented. Distinguishing image artifacts from newly resolved sample features is essential for future SIM applications in cell biology.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

20201 - Electrical and electronic engineering

Project

<a href="/en/project/GA17-05840S" target="_blank" >GA17-05840S: Multicriteria Optimization of Shift-Variant Imaging System Models</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Applications of Digital Image Processing XL

ISBN

978-1-5106-1249-5

ISSN

0277-786X

e-ISSN

—

Number of pages

12

Pages from-to

"1039632-1"-"1039632-13"

Publisher name

SPIE

Place of publication

Bellingham

Event location

San Diego, California

Event date

Aug 6, 2017

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

000418443700087