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Hot Pixels Suppression in Structured Illumination Microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00312004" target="_blank" >RIV/68407700:21230/17:00312004 - isvavai.cz</a>

  • Result on the web

    <a href="http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf" target="_blank" >http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Hot Pixels Suppression in Structured Illumination Microscopy

  • Original language description

    Structured Illumination Microscopy (SIM) is a super-resolution fluorescence technique which enables to enhance the resolution of optical microscopes beyond the diffraction limit. The final super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require the input images with high signal to noise ratio (SNR). However, the light emitted from the sample labeled with a fluorescence dye is weak. Therefore, the long exposure time (in the order of seconds) is required. The low number of photons, due to the weakness of fluorescence dye, captured by camera sensor causes the high bias of the acquired image by additional noise sources (read-out noise, Poisson noise). Further, the long exposure time leads to the thermal noise. In this paper, we focus on the thermal noise, especially on the hot pixels, whose values are four or more standard deviations above the mean. These hot pixels dramatically decrease the dynamic range of final discrete value image. Therefore, the SIM image reconstruction may fail because of the normalization and rounding during the reconstruction.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the International Student Scientific Conference Poster – 21/2017

  • ISBN

    978-80-01-06153-4

  • ISSN

  • e-ISSN

  • Number of pages

    70

  • Pages from-to

  • Publisher name

    Czech Technical University in Prague

  • Place of publication

    Praha

  • Event location

    Praha

  • Event date

    May 23, 2017

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article