Hot Pixels Suppression in Structured Illumination Microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00312004" target="_blank" >RIV/68407700:21230/17:00312004 - isvavai.cz</a>
Result on the web
<a href="http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf" target="_blank" >http://radio.feld.cvut.cz/conf/poster/proceedings/Poster_2017/Section_EI/EI_041_Pospisil.pdf</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Hot Pixels Suppression in Structured Illumination Microscopy
Original language description
Structured Illumination Microscopy (SIM) is a super-resolution fluorescence technique which enables to enhance the resolution of optical microscopes beyond the diffraction limit. The final super-resolution image quality strongly depends on the performance of SIM image reconstruction. Standard SIM methods require the input images with high signal to noise ratio (SNR). However, the light emitted from the sample labeled with a fluorescence dye is weak. Therefore, the long exposure time (in the order of seconds) is required. The low number of photons, due to the weakness of fluorescence dye, captured by camera sensor causes the high bias of the acquired image by additional noise sources (read-out noise, Poisson noise). Further, the long exposure time leads to the thermal noise. In this paper, we focus on the thermal noise, especially on the hot pixels, whose values are four or more standard deviations above the mean. These hot pixels dramatically decrease the dynamic range of final discrete value image. Therefore, the SIM image reconstruction may fail because of the normalization and rounding during the reconstruction.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the International Student Scientific Conference Poster – 21/2017
ISBN
978-80-01-06153-4
ISSN
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e-ISSN
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Number of pages
70
Pages from-to
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Publisher name
Czech Technical University in Prague
Place of publication
Praha
Event location
Praha
Event date
May 23, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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