An Interferometric Sensor for Scanning Microwave Microscopy Application

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00327394" target="_blank" >RIV/68407700:21230/18:00327394 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/8617173" target="_blank" >https://ieeexplore.ieee.org/document/8617173</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.23919/APMC.2018.8617173" target="_blank" >10.23919/APMC.2018.8617173</a>

Result language
angličtina
Original language name
An Interferometric Sensor for Scanning Microwave Microscopy Application
Original language description
The development of an interferometric sensor for scanning microwave microscopy is proposed. The structure is based on the concept of Wilkinson power divider; by using multistage sections of microstrip lines and resistors the operational bandwidth is increased. The optimization of dimension parameters and resistors values is discussed. The sensor was experimentally investigated in frequency band 45 MHz to 26 GHz. 40 times reduction of the reflection coefficient measurement uncertainty compared to standard VNA reflection measurement was achieved.
Czech name
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Czech description
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Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
2018 Asia-Pacific Microwave Conference Proceedings
ISBN
978-1-5386-2184-4
ISSN
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e-ISSN
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Number of pages
3
Pages from-to
1232-1234
Publisher name
The Institute of Electronics Information and Communication Engineers of Japan
Place of publication
Tokio
Event location
Kyoto
Event date
Dec 6, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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