X-CHIP-03: SOI MAPS radiation sensor with hit-counting and ADC mode
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00334362" target="_blank" >RIV/68407700:21230/18:00334362 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21340/18:00334362
Result on the web
<a href="https://ieeexplore.ieee.org/document/8824681" target="_blank" >https://ieeexplore.ieee.org/document/8824681</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/NSSMIC.2018.8824681" target="_blank" >10.1109/NSSMIC.2018.8824681</a>
Alternative languages
Result language
angličtina
Original language name
X-CHIP-03: SOI MAPS radiation sensor with hit-counting and ADC mode
Original language description
This work presents a novel MAPS sensor X-CHIP-03 developed for soft X-ray radiation imaging and advanced dosimetry. X-CHIP-03 was fabricated in a 180 nm SOI CMOS technology. The presented sensor contains a matrix of 64 x 64 pixels with 60 μm pixel pitch. Advantage of this technology is possibility to integrate complex electronics in the pixels while preserving 100% fill factor for radiation detection. Novel feature of this SOI MAPS sensor is capability to operate the sensor in the hit-counting mode or in the ADC mode. The hit counting mode is primarily designed for radiation imaging and the ADC mode is intended for measurement of energy deposited in each pixel. The effective (linear) dynamic range is from 5 keV to 20 keV of the energy deposited in the sensitive layer. The first measurement results are presented.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC)
ISBN
978-1-5386-8494-8
ISSN
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e-ISSN
2577-0829
Number of pages
4
Pages from-to
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Publisher name
Institute of Electrical and Electronics Engineers, Inc.
Place of publication
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Event location
Sydney
Event date
Nov 10, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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