Tracking Deadtime Algorithm for GaN DC/DC Converter
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F19%3A00333922" target="_blank" >RIV/68407700:21230/19:00333922 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/8866992" target="_blank" >https://ieeexplore.ieee.org/document/8866992</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.23919/AE.2019.8866992" target="_blank" >10.23919/AE.2019.8866992</a>
Alternative languages
Result language
angličtina
Original language name
Tracking Deadtime Algorithm for GaN DC/DC Converter
Original language description
The presented method automatically adjusts the deadtime of gallium nitride (GaN) transistors in half-bridge to increase the efficiency. This removes the need of manual measuring and setting the deadtime of the finished converter. The developed algorithm was tested and compared with the fixed deadtime case. The obtained results show that the developed algorithm is achieving higher and more stable efficiency compared to selected fixed deadtime.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2019 International Conference on Applied Electronics
ISBN
978-80-261-0812-2
ISSN
1339-3944
e-ISSN
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Number of pages
4
Pages from-to
151-154
Publisher name
University of West Bohemia
Place of publication
Pilsen
Event location
Pilsen
Event date
Sep 10, 2019
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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