ADC Input Currents Measurement

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00368476" target="_blank" >RIV/68407700:21230/23:00368476 - isvavai.cz</a>
Result on the web
<a href="https://conferences.imeko.org/event/3/" target="_blank" >https://conferences.imeko.org/event/3/</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
ADC Input Currents Measurement
Original language description
The contribution introduces the possible issue of internal CMOS Successive Approximation Register microcontroller's Analog-to-Digital Converters input currents. If the microcontroller also contains a multiplexer, it can lead to consequences caused by the sample-and-hold block that is part of a charge redistribution Analog-to-Digital Converter. The article presents its nature, the possibility of its measurement, and a simplified model of such an MCU analog inputs behavior. The simplified model and derived formulas can help the unacquainted user in a data acquisition system with the MCU design when measuring signal sources with non-negligible internal resistance. The introduced parameters, which cannot be found in datasheets, can be essential for users.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
ACADEMIA meets INDUSTRY IMEKO TC-4 International Symposium PROCEEDINGS
ISBN
978-3-033-09885-5
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
30-34
Publisher name
IMEKO TC4 Technical Committee on Measurement of Electrical Quantities
Place of publication
Budapest
Event location
Pordenone
Event date
Sep 19, 2023
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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