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Input Currents of CMOS SAR ADC in Microcontroller, their Measurement and Behavior Model from Users Point of View

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00375579" target="_blank" >RIV/68407700:21230/24:00375579 - isvavai.cz</a>

  • Result on the web

    <a href="http://hdl.handle.net/10467/121990" target="_blank" >http://hdl.handle.net/10467/121990</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.measurement.2024.115143" target="_blank" >10.1016/j.measurement.2024.115143</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Input Currents of CMOS SAR ADC in Microcontroller, their Measurement and Behavior Model from Users Point of View

  • Original language description

    The article introduces possible issue of internal CMOS SAR microcontroller's ADC input currents. It describes a nature of the ADC input current and its dependence on a sampling frequency. Methods for measurement of parameters such as input charge, residual voltage, and equivalent capacitance of sample-hold circuits are presented and used in the proposed simplified model of ADC input behavior. These parameters, which are not listed in datasheets, if not respected in data acquisition designs, can adversely affect how the ADC is used when measuring signal sources with nonnegligible internal resistance. The article also explains how to solve a voltage measurement on a source with high internal resistance even in a situation where, according to datasheets, it should already have limitations. The proposed simplified CMOS SAR ADC input behavior model in an MCU can help users in MCU-based data acquisition system design.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Measurement

  • ISSN

    0263-2241

  • e-ISSN

    1873-412X

  • Volume of the periodical

    236

  • Issue of the periodical within the volume

    236

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    10

  • Pages from-to

    1-10

  • UT code for WoS article

    001332471400001

  • EID of the result in the Scopus database

    2-s2.0-85196557252