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Ultralow-Frequency Noise in High-Bias Precision DC-Coupled Voltage Measurements

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F25%3A00389635" target="_blank" >RIV/68407700:21230/25:00389635 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1109/I2MTC62753.2025.11079148" target="_blank" >https://doi.org/10.1109/I2MTC62753.2025.11079148</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/I2MTC62753.2025.11079148" target="_blank" >10.1109/I2MTC62753.2025.11079148</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Ultralow-Frequency Noise in High-Bias Precision DC-Coupled Voltage Measurements

  • Original language description

    In research on magnetic sensors and magnetometers (and not only in this field), there is often a need for precise measurement of small voltage variations under high bias or common-mode conditions. These variations are typically at low or ultralow frequencies (ULF, 1 mHz-1 Hz). As the noise of analog-to-digital (AD) and digital-to-analog converters (DA) are scaled with higher values of direct-current bias, we investigate the noise limits of direct measurement and also the ULF noise of voltage references and DA converters suitable for subtracting the large DC bias. We characterized several low-noise references and two D/A converters, with the help of a Weston cell as a DC bias source with ultimately low ultralow-frequency noise. We conclude that a 12-bit DAC with a recently introduced voltage reference is finally able to achieve noise below 0.1 ppm/root Hz at 0.1 Hz.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2025)

  • ISBN

    979-8-3315-0501-1

  • ISSN

    2642-2069

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Chemnitz

  • Event date

    May 19, 2025

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    001554207900214