Experience of Advanced Methods Based on FFT Test Application

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F99%3A03018774" target="_blank" >RIV/68407700:21230/99:03018774 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Experience of Advanced Methods Based on FFT Test Application

Original language description

The methods for testing of ADC dynamic quality (FFT Test, Best Sinusoidal Curve Fit Method, Histogram Test) require a low-distortion testing signal. It brings some problems for testing of high-resolution ADCs. The paper describes an practical experienceusing two alternative methods - the Spectrum Correction Test and the Two-tone method. The systems for an evaluation of both tests were designed and realised. The first experience and achieved results are published in this paper. The experiments have shown, that these methods are usable, but before their application for testing of high resolution ADCs it is necessary to solved several practical problems.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

1999

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

IWADC'99 - 4th International Workshop on ADC Modelling and Testing

ISBN

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ISSN

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e-ISSN

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Number of pages

4

Pages from-to

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Publisher name

Laboratoire IXL-ENSERB

Place of publication

Bordeaux

Event location

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Event date

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Type of event by nationality

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UT code for WoS article

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