Test pattern compression based on pattern overlapping and broadcasting
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00182780" target="_blank" >RIV/68407700:21240/11:00182780 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Test pattern compression based on pattern overlapping and broadcasting
Original language description
Integrated circuits (IC) are traditionally tested using tester device called an Automatic Test Equipment (ATE). Test data are stored in the ATE and are transferred to the circuit during test. Responses are than transferred back to the ATE and compared with stored correct responses whether the circuit under test (CUT) is fault free or not. With each IC technology generation, the developments in this field has lead to computer chips containing more complex logic, thus the test data amount and test time increase rapidly. This problem is usually solved by using various test compression techniques. Test compression involves storing compressed test data in the ATE, test data transfer in compressed form and on-chip test data decompression. Compressed Test Pattern Sequencer (COMPAS) is a test compression technique based on pattern overlapping that has high compression ratio. It uses...
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceeding of the 7th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science
ISBN
978-80-214-4305-1
ISSN
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e-ISSN
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Number of pages
1
Pages from-to
111
Publisher name
Brno University of Technology
Place of publication
Brno
Event location
Lednice
Event date
Oct 14, 2011
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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