Influence of substrate material on spectral properties and thermal quenching of photoluminescence of silicon vacancy colour centres in diamond thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F17%3A00317075" target="_blank" >RIV/68407700:21340/17:00317075 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/17:00481233
Result on the web
<a href="https://doi.org/10.1515/jee-2017-0048" target="_blank" >https://doi.org/10.1515/jee-2017-0048</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1515/jee-2017-0048" target="_blank" >10.1515/jee-2017-0048</a>
Alternative languages
Result language
angličtina
Original language name
Influence of substrate material on spectral properties and thermal quenching of photoluminescence of silicon vacancy colour centres in diamond thin films
Original language description
Nanocrystalline diamond films with bright photoluminescence of silicon-vacancy colour centres have been grown using a microwave plasma enhanced CVD technique. The influence of substrate material (quartz, Al2O3 , Mo and Si) on a reproducible fabrication of diamond thin films with Si-V optical centres is presented. Film quality and morphology are characterized by Raman spectroscopy and SEM technique. SEM shows well faceted diamond grains with sizes from 170 to 300 nm. The diamond peak is confirmed in Raman spectra for all samples. In the case of the quartz substrate, a redshift of the diamond peak is observed (~ 3.5 cm-1 ) due to tension in the diamond film. The steady-state photoluminescence intensity was measured in the temperature range from 11 K to 300 K. All spectra consist of a broad emission band with a maximum near 600 nm and of a sharp zero phonon line in the vicinity of 738 nm corresponding to Si-V centres that is accompanied with a phonon sideband peaking at 757 nm. Activation energies for the thermal quenching of Si-V centre photoluminescence were determined and the effect of the substrate on photoluminescence properties is discussed too.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Electrical Engineering
ISSN
1335-3632
e-ISSN
1339-309X
Volume of the periodical
68
Issue of the periodical within the volume
7
Country of publishing house
PL - POLAND
Number of pages
7
Pages from-to
3-9
UT code for WoS article
000423262300002
EID of the result in the Scopus database
2-s2.0-85040813214