Rapid Thermal Annealing of YAG based planar waveguides prepared by PLD
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F12%3A00193292" target="_blank" >RIV/68407700:21460/12:00193292 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Rapid Thermal Annealing of YAG based planar waveguides prepared by PLD
Original language description
Amorphous erbium doped yttrium aluminium oxide deposited by pulsed laser deposition (PLD) was annealed by the rapid thermal annealing technique. The influence of annealing parameters and starting layer properties on resulting crystalline structure, surface roughness, and waveguiding properties are studied. Atomic force microscopy and scanning electron microscopy (SEM) techniques were applied to study the surface morphology and growth structure inside the layer (SEM of cleaved layer). X-ray diffraction was implemented to study the changes of crystalline structure. The results are compared to the layers prepared by PLD technique with high substrate temperature.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů