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Thin Film Limit Correction Method to the Surface Defective Layer in Low Absorption Spectroscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F15%3A00241298" target="_blank" >RIV/68407700:21460/15:00241298 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1166/asem.2015.1699" target="_blank" >http://dx.doi.org/10.1166/asem.2015.1699</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1166/asem.2015.1699" target="_blank" >10.1166/asem.2015.1699</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Thin Film Limit Correction Method to the Surface Defective Layer in Low Absorption Spectroscopy

  • Original language description

    We derive the so-called thin-film limit correction method to the surface defective layer in a low absorption spectroscopy as a novel approach to formulae for transmittance (T ), reflectance (R) and absorptance (A) in highly versatile and accurate form. We draw attention to two remarkable consequences of the thin-film limit: (i) The optical properties depend on the product of the absorption coefficient, thickness and refraction index. (ii) The absorptance strongly depends on the index of refraction of the surrounding media. Based on these assumptions a new method is presented that allows direct evaluation of ultrathin surface defective layer absorptance. This presents a direct and elegant way avoiding complex evaluation of surface defective layer. Finally, we perform experimental verification on hydrogenated amorphous silicon (a-Si:H) thin films and we show that the optical absorption of the double layer of undoped thin film layer coated with the ultrathin doped layer is higher then the

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Advanced Science, Engineering and Medicine

  • ISSN

    2164-6635

  • e-ISSN

  • Volume of the periodical

    7

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    4

  • Pages from-to

    343-346

  • UT code for WoS article

  • EID of the result in the Scopus database