Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F18%3A00329980" target="_blank" >RIV/68407700:21670/18:00329980 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1088/1748-0221/13/04/P04002" target="_blank" >http://dx.doi.org/10.1088/1748-0221/13/04/P04002</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/13/04/P04002" target="_blank" >10.1088/1748-0221/13/04/P04002</a>
Alternative languages
Result language
angličtina
Original language name
Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays
Original language description
Direct conversion semiconductor detectors have become an indispensable tool in radiation detection by now. In order to obtain a high detection efficiency, especially when detecting X or gamma rays, high-Z semiconductor sensors are necessary. Like other compound semiconductors GaAs, compensated by chromium (GaAs:Cr), suffers from a number of defects that affect the charge collection efficiency and homogeneity of the material. A precise knowledge of this problem is important to predict the performance of such detectors and eventually correct their response in specific applications. In this study we analyse the homogeneity and mobility-lifetime products (mu(e)tau(e)) of a 500 mu m thick GaAs:Cr pixelated sensor connected to a Timepix chip. The detector is irradiated by 23 keV X-rays, each pixel recording the number of photon interactions and the charge they induce on its electrode. The mu(e)tau(e) products are extracted on a per-pixel basis, using the Hecht equation corrected for the small pixel effect. The detector shows a good time stability in the experimental conditions. Significant inhomogeneities are observed in photon counting and charge collection efficiencies. An average mu(e)tau(e) of 1.0.10(-4) cm(2) V-1 is found, and compared with values obtained by other methods for the same material. Solutions to improve the response are discussed.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10303 - Particles and field physics
Result continuities
Project
<a href="/en/project/EF16_019%2F0000766" target="_blank" >EF16_019/0000766: Engineering applications of microworld physics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
1748-0221
Volume of the periodical
13
Issue of the periodical within the volume
P04002
Country of publishing house
GB - UNITED KINGDOM
Number of pages
13
Pages from-to
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UT code for WoS article
000429055400002
EID of the result in the Scopus database
2-s2.0-85046637366