THE I-V CHARACTERISTIC COMPARISON METHOD IN ELECTRONIC COMPONENT DIAGNOSTICS
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F12%3A43869106" target="_blank" >RIV/70883521:28140/12:43869106 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
THE I-V CHARACTERISTIC COMPARISON METHOD IN ELECTRONIC COMPONENT DIAGNOSTICS
Original language description
I-V characteristics of individual electronic components or electronic circuits have been playing a very important role in diagnostics for many years. The latest technological advance has extended the analytical potential of that method even more. This paper presents some examples how the I-V characteristic comparison can reveal the differences between the chosen approved model component and some other alternative components manufactured by different producers. The differences might be caused also with atreatment history like thermal or electrostatic discharge exposition.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED2.1.00%2F03.0089" target="_blank" >ED2.1.00/03.0089: The Centre of Security, Information and Advanced Technologies (CEBIA-Tech)</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
XX IMEKO World Congress
ISBN
978-89-950000-5-2
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
"N"
Publisher name
IMEKO
Place of publication
Busan
Event location
Busan
Event date
Sep 9, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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