Advanced microscopic techniques used for integrated circuits authenticity analysis

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F18%3A63520712" target="_blank" >RIV/70883521:28140/18:63520712 - isvavai.cz</a>
Result on the web
<a href="https://iopscience.iop.org/article/10.1088/1742-6596/1065/10/102015/pdf" target="_blank" >https://iopscience.iop.org/article/10.1088/1742-6596/1065/10/102015/pdf</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1742-6596/1065/10/102015" target="_blank" >10.1088/1742-6596/1065/10/102015</a>

Result language
angličtina
Original language name
Advanced microscopic techniques used for integrated circuits authenticity analysis
Original language description
Many electronic systems used in industry or other special areas are put at risk by counterfeit electronic components occurrence, especially by semiconductors. These counterfeit components represent a serious threat for systems functionality and reliability. We can take as a fraudulent or as a suspicious component any component of unknown origin, which we can find any difference in contrast to the original manufacturer component of the same model. This article describes advanced microscopic techniques used in problems with counterfeit integrated circuits. Their genuineness evaluation ability is discussed and illustrated with several microscopic images.
Czech name
—
Czech description
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Project
<a href="/en/project/LO1303" target="_blank" >LO1303: Promoting sustainability and development of the Centre for Security, Information and Advanced Technologies (CEBIA-Tech)</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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