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47 069 (0,207s)

Result

Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Coherent X-ray diffraction was used to measure the type, quantity and the relative distances between stacking faults along the growth direction of two individual of the diffracted intensity distribution of...

Condensed matter physics (including formerly solid state physics, supercond.)

  • 2017
  • Jimp
  • Link
Result

Mmeasurements of spatial coherence of X-ray lasers by diffraction on haircross wires.

Diffraction of a partially coherent beam on narrow elongated obstacles in an XRL experiment, is numerically investigated.

BH - Optika, masery a lasery

  • 2002
  • D
Result

Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM orientation is mapped out using SXRM by measur...

Condensed matter physics (including formerly solid state physics, supercond.)

  • 2017
  • Jimp
  • Link
Result

Monitoring heat-treatment and forming processes by X-ray diffraction topography

X-ray diffraction topography proves to be an efficient technique to follow. It is important that the contrast observed on x-ray topographs is based on diffraction which of micrographs and x

JS - Řízení spolehlivosti a kvality, zkušebnictví

  • 2003
  • D
Result

Single-shot spatial coherence studies of plasma based X-ray laser

We present a single-shot method of spatial coherence measurement based on the evaluation of the far-field diffraction pattern from a specially designed 1D and 2D binary masks. The method was demonstrated using a plasma-based Zn ...

Optics (including laser optics and quantum optics)

  • 2024
  • O
  • Link
Result

Selective coherent x-ray diffractive imaging of displacement fields in (Ga,Mn)As/GaAs periodic wires

Coherent x-ray diffractive imaging is extended to high resolution strain analysis in crystalline nanostructured devices. The method now enables reconstruction of elastic strain distribution in layered nanowires or ...

BM - Fyzika pevných látek a magnetismus

  • 2011
  • Jx
  • Link
Result

Measurements of spatial coherence of X-ray lasers by diffraction on haircross wires

Not available...

BH - Optika, masery a lasery

  • 2002
  • D
Result

Thermal x-ray diffraction and near-field phase contrast imaging

of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve ...

Optics (including laser optics and quantum optics)

  • 2017
  • Jimp
  • Link
Result

X-ray Diffraction Study of Anisotropic State of Residual Stress after Down-cut and Up-cut Face Grinding

By means of X-ray diffraction analysis, ground plates made from three types of steel were investigated in order to compute and compare both macroscopic and microscopic residual stress and domains of coherent scatte...

JG - Hutnictví, kovové materiály

  • 2009
  • Jx
Result

Thermal x-ray diffraction and near-field phase contrast imaging

of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve ...

Optics (including laser optics and quantum optics)

  • 2017
  • Jimp
  • Link
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