Capability of Electron Microscopy in Forensic Science

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F19%3AN0000002" target="_blank" >RIV/00007064:K01__/19:N0000002 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1017/S143192761800644X" target="_blank" >http://dx.doi.org/10.1017/S143192761800644X</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S143192761800644X" target="_blank" >10.1017/S143192761800644X</a>

Result language
angličtina
Original language name
Capability of Electron Microscopy in Forensic Science
Original language description
The possibilities of electron microscopy have been recently greatly enhanced by the use of dual systems with a focused ion beam. Probably the most widely used FIB technique in forensic science is the use of Ga+ ions. These techniques allow the addition and removal of materials (molecular level), imaging in secondary ions and, optionally, performing ion microanalysis. For the time being, SEM/FIB technology has found applications in the following areas of forensic practice: Analysis of superposition of toner/writing ink, Thermogenetic particles, Nanocomposites and nanoparticles, Deformations in alloys, etc. The use of modern SEM techniques brings to forensic science new possibilities and use of evidence from traces that have been difficult to process or unusable in the past. Techniques are successfully used in a number of real cases where conventional techniques have been unable to provide a clear answer to investigators' questions
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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