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Atomic force microscopy studies of cross-sections of columnar thin films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F07%3A%230000392" target="_blank" >RIV/00177016:_____/07:#0000392 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1088/0957-0233/18/2/S28" target="_blank" >http://dx.doi.org/10.1088/0957-0233/18/2/S28</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/0957-0233/18/2/S28" target="_blank" >10.1088/0957-0233/18/2/S28</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Atomic force microscopy studies of cross-sections of columnar thin films

  • Original language description

    In this paper, the columnar structure of TiO2 and HfO2 thin films prepared on silicon wafers is studied using two modifications of atomic force microscopy (AFM), i.e., by standard AFM and micro-hardness modification of AFM. These methods are applied to the cross-sections of the films created by fracturing samples consisting of substrates covered with the films under investigation. It is shown that the edge of the film in the cross-section does not cause an obstacle for scanning the AFM images corresponding to both the AFM modifications mentioned above. In this paper it is also shown that the micro-hardness contrast mode of AFM is the more useful technique for imaging the columnar structure of films than standard AFM when film cross-sections exhibit artificial defects originated as a consequence of fracturing the films.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/KAN311610701" target="_blank" >KAN311610701: Nanometrology using methods of scanning probe microscopy</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2007

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Measurement Science and Technology

  • ISSN

    0957-0233

  • e-ISSN

  • Volume of the periodical

    18

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    4

  • Pages from-to

    528-531

  • UT code for WoS article

  • EID of the result in the Scopus database