Synthetic Data in Quantitative Scanning Probe Microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F21%3AN0000016" target="_blank" >RIV/00177016:_____/21:N0000016 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26620/21:PU142112

Result on the web

<a href="https://www.mdpi.com/2079-4991/11/7/1746" target="_blank" >https://www.mdpi.com/2079-4991/11/7/1746</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/nano11071746" target="_blank" >10.3390/nano11071746</a>

Result language

angličtina

Original language name

Synthetic Data in Quantitative Scanning Probe Microscopy

Original language description

Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

21100 - Other engineering and technologies

Project

<a href="/en/project/8B20002" target="_blank" >8B20002: High throughput metrology for nanowire energy harvesting devices</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2021

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Nanomaterials

ISSN

2079-4991

e-ISSN

—

Volume of the periodical

11

Issue of the periodical within the volume

7

Country of publishing house

CH - SWITZERLAND

Number of pages

26

Pages from-to

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UT code for WoS article

000676561700001

EID of the result in the Scopus database

2-s2.0-85118093327