Electron inelastic mean free paths (IMFPs) in binary Au-Cu alloys determined by elastic - peak electron spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F01%3A00105210" target="_blank" >RIV/00216208:11320/01:00105210 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Electron inelastic mean free paths (IMFPs) in binary Au-Cu alloys determined by elastic - peak electron spectroscopy
Original language description
Electron inelastic mean free paths (IMFPs) in binary Au-Cu alloys determined by elastic - peak electron spectroscopy
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/OK%20409" target="_blank" >OK 409: Development of plasma-based products and processes</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Interface Analysis
ISSN
0142-2421
e-ISSN
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Volume of the periodical
31
Issue of the periodical within the volume
5
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
415-420
UT code for WoS article
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EID of the result in the Scopus database
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