Ultra-thin oxide layer formation on Cu-9%Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F06%3A00206038" target="_blank" >RIV/00216208:11320/06:00206038 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Ultra-thin oxide layer formation on Cu-9%Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopy

Original language description

annotation in the original language Ultra-thin oxide layer formation on Cu-9%Al(111) surface and Pd growth studied using reflection high energy electron diffraction and Auger electron spectroscopy

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2006

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Surface Science

ISSN

0039-6028

e-ISSN

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Volume of the periodical

600

Issue of the periodical within the volume

18

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

4

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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