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Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F08%3A00206790" target="_blank" >RIV/00216208:11320/08:00206790 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation

  • Original language description

    The elastic anisotropy of the Cr-Al-(Si-)N and Ti-Al-(Si-)N thin film nanocomposites with different aluminium and silicon contents deposited by the cathodic arc evaporation was investigated using complementary X-ray diffraction methods. Glancing angle X-ray diffraction (GAXRD) was employed to get the first information about the anisotropy of the elastic constants. The measurements done on an X-ray diffractometer equipped with an Eulerian cradle were used for calculation of the lattice strain and residual stress using the Crystallite Group Method and for determination of the preferred orientation of crystallites. In most samples, the degree of the elastic anisotropy decreased with increasing aluminium and silicon contents. Still, depending on the transition metal (Cr and/or Ti), different dependences of the elastic anisotropy on the aluminium and silicon contents were observed that could be related to the phase stability regions of the cubic phase in thin film nanocomposites.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Zeitschrift für Kristallographie

  • ISSN

    0044-2968

  • e-ISSN

  • Volume of the periodical

    27

  • Issue of the periodical within the volume

    27

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    8

  • Pages from-to

  • UT code for WoS article

    000264441800028

  • EID of the result in the Scopus database