Crystallization and Microstructure Evolution of TiO2 Thin Films and Powders Studied by XRD Total Pattern Fitting and Stress Analysis

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206361" target="_blank" >RIV/00216208:11320/09:00206361 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Crystallization and Microstructure Evolution of TiO2 Thin Films and Powders Studied by XRD Total Pattern Fitting and Stress Analysis

Original language description

Different TiO2 samples - magnetron deposited amorphous and nanocrystalline thin films and powders - were annealed both off-situ and in-situ in XRD high-temperature chamber and their microstructure evolution with temperature and time was studied.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Acta Crystallographica. Section A. Foundations of Crystallography

ISSN

0108-7673

e-ISSN

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Volume of the periodical

65

Issue of the periodical within the volume

neuvedeno

Country of publishing house

DK - DENMARK

Number of pages

1

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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