Photoemission study of the tin doped cerium oxide thin films prepared by RF magnetron sputtering

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F10%3A10071385" target="_blank" >RIV/00216208:11320/10:10071385 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Photoemission study of the tin doped cerium oxide thin films prepared by RF magnetron sputtering

Original language description

Ce-Sn-O mixed oxide films prepared by simultaneous Sn metal and cerium oxide magnetron sputtering were studied by high resolution photoemission. The analysis showed that the degree of reduction of the cerium oxide depends on the tin concentration in thefilm. Ce4+ -} Ce3+ conversion is explained by a charge transfer from Sn atoms to unoccupied orbital Ce 4f(0) of cerium oxide by forming Ce 4f(1) state.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Thin Solid Films

ISSN

0040-6090

e-ISSN

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Volume of the periodical

518

Issue of the periodical within the volume

8

Country of publishing house

CH - SWITZERLAND

Number of pages

4

Pages from-to

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UT code for WoS article

000274812800056

EID of the result in the Scopus database

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