Effect of temperature on photoexcited charge carrier dynamics in Si-NCs/SiO2 superlattices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10173371" target="_blank" >RIV/00216208:11320/13:10173371 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2022723" target="_blank" >http://dx.doi.org/10.1117/12.2022723</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2022723" target="_blank" >10.1117/12.2022723</a>
Alternative languages
Result language
angličtina
Original language name
Effect of temperature on photoexcited charge carrier dynamics in Si-NCs/SiO2 superlattices
Original language description
An experimental study of the temperature dependence of photoluminescence time decay in size-controlled silicon nanocrystals in silicon nanocrystal/SiO2 superlattices is reported. The samples were prepared using thermal evaporation and subsequent thermally induced phase separation. The slow (microseconds) decay line shape is described well by a stretched exponential. The temperature dependence of the photoluminescence dynamics can be understood in terms of thermal activation of recombination processes, including hopping of carriers between localized states. Additional hydrogen treatment causes an increase in both parameters of the stretched exponential function. This behavior is interpreted as a consequence of H-2-passivation of dangling bonds defects.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
—
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE - The International Society for Optical Engineering
ISBN
978-0-8194-9657-7
ISSN
0277-786X
e-ISSN
—
Number of pages
6
Pages from-to
"88070V1"-6
Publisher name
SPIE-INT SOC OPTICAL ENGINEERING
Place of publication
BELLINGHAM
Event location
San Diego, USA
Event date
Aug 25, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000327304600011