Defect studies of ZnO films prepared by pulsed laser deposition on various substrates

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10189491" target="_blank" >RIV/00216208:11320/13:10189491 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/13:00398548
Result on the web
<a href="http://dx.doi.org/10.1088/1742-6596/443/1/012018" target="_blank" >http://dx.doi.org/10.1088/1742-6596/443/1/012018</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1742-6596/443/1/012018" target="_blank" >10.1088/1742-6596/443/1/012018</a>

Result language
angličtina
Original language name
Defect studies of ZnO films prepared by pulsed laser deposition on various substrates
Original language description
ZnO thin films deposited on various substrates were characterized by slow positron implantation spectroscopy (SPIS) combined with X-ray diffraction (XRD). All films studied exhibit wurtzite structure and crystallite size 20-100 nm. The mosaic spread of crystallites is relatively small for the films grown on single crystalline substrates while it is substantial for the film grown on amorphous substrate. SPIS investigations revealed that ZnO films deposited on single crystalline substrates exhibit significantly higher density of defects than the film deposited on amorphous substrate. This is most probably due to a higher density of misfit dislocations, which compensate for the lattice mismatch between the film and the substrate.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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