Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00378662" target="_blank" >RIV/68378271:_____/12:00378662 - isvavai.cz</a>

Alternative codes found

RIV/00216208:11320/12:10127757

Result on the web

<a href="http://dx.doi.org/10.1088/0022-3727/45/22/225101" target="_blank" >http://dx.doi.org/10.1088/0022-3727/45/22/225101</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/0022-3727/45/22/225101" target="_blank" >10.1088/0022-3727/45/22/225101</a>

Result language

angličtina

Original language name

Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition

Original language description

ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopyand defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ...

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2012

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Physics D-Applied Physics

ISSN

0022-3727

e-ISSN

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Volume of the periodical

45

Issue of the periodical within the volume

22

Country of publishing house

GB - UNITED KINGDOM

Number of pages

12

Pages from-to

1-12

UT code for WoS article

000305175100003

EID of the result in the Scopus database

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