A method to extract pure Raman spectrum of epitaxial graphene on SiC

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10190025" target="_blank" >RIV/00216208:11320/13:10190025 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1063/1.4830374" target="_blank" >http://dx.doi.org/10.1063/1.4830374</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4830374" target="_blank" >10.1063/1.4830374</a>

Result language

angličtina

Original language name

A method to extract pure Raman spectrum of epitaxial graphene on SiC

Original language description

The Raman spectrum of epitaxial graphene on SiC is generally obtained by simply subtracting a SiC spectra from the experimental data, which results in noisy spectrum and negative intensity. By using a Non-negative Matrix Factorization (NMF) method, we obtain pure graphene spectra, even for monolayer graphene and sub-micron size patterned features, as well as in spatial mapping and depth profile. We show that the NMF method is efficient in data smoothing and for signal deconvolution with no assumption required for the functional form of the signals.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Physics Letters

ISSN

0003-6951

e-ISSN

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Volume of the periodical

103

Issue of the periodical within the volume

20

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

1-5

UT code for WoS article

000327818700038

EID of the result in the Scopus database

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