Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10369515" target="_blank" >RIV/00216208:11320/17:10369515 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1107/S1600577517009584" target="_blank" >http://dx.doi.org/10.1107/S1600577517009584</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600577517009584" target="_blank" >10.1107/S1600577517009584</a>

Result language
angličtina
Original language name
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction
Original language description
Coherent X-ray diffraction was used to measure the type, quantity and the relative distances between stacking faults along the growth direction of two individual wurtzite GaAs nanowires grown by metalorganic vapour epitaxy. The presented approach is based on the general property of the Patterson function, which is the autocorrelation of the electron density as well as the Fourier transformation of the diffracted intensity distribution of an object. Partial Patterson functions were extracted from the diffracted intensity measured along the [000 (1) over bar] direction in the vicinity of the wurtzite [00 (1) over bar(5) over bar] Bragg peak. The maxima of the Patterson function encode both the distances between the fault planes and the type of the fault planes with the sensitivity of a single atomic bilayer. The positions of the fault planes are deduced from the positions and shapes of the maxima of the Patterson function and they are in excellent agreement with the positions found with transmission electron microscopy of the same nanowire.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
<a href="/en/project/EF15_003%2F0000485" target="_blank" >EF15_003/0000485: Nanomaterials centre for advanced applications</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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