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Diffuse X-ray scattering from local chemical inhomogeneities in InGaN layers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10379317" target="_blank" >RIV/00216208:11320/18:10379317 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216224:14310/18:00106421

  • Result on the web

    <a href="https://doi.org/10.1107/S1600576718007173" target="_blank" >https://doi.org/10.1107/S1600576718007173</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1107/S1600576718007173" target="_blank" >10.1107/S1600576718007173</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Diffuse X-ray scattering from local chemical inhomogeneities in InGaN layers

  • Original language description

    Diffuse X-ray scattering from random chemical inhomogeneities in epitaxial layers of InGaN/GaN was simulated using linear elasticity theory and kinematical X-ray diffraction. The simulation results show the possibility of determining the r.m.s. deviations of the local In content and its lateral correlation length from reciprocal-space maps of the scattered intensity. The reciprocal-space distribution of the intensity scattered from inhomogeneities is typical and it can be distinguished from other sources of diffuse scattering such as threading or misfit dislocations.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Applied Crystallography [online]

  • ISSN

    1600-5767

  • e-ISSN

  • Volume of the periodical

    51

  • Issue of the periodical within the volume

    Leden

  • Country of publishing house

    JP - JAPAN

  • Number of pages

    13

  • Pages from-to

    969-981

  • UT code for WoS article

    000440411700001

  • EID of the result in the Scopus database

    2-s2.0-85051067191