Optical constants of ZnTe and ZnSe epitaxial thin films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F03%3A00008102" target="_blank" >RIV/00216224:14310/03:00008102 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Optical constants of ZnTe and ZnSe epitaxial thin films
Original language description
In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combinedoptical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.
Czech name
—
Czech description
—

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—

Project
<a href="/en/project/GA202%2F01%2F1110" target="_blank" >GA202/01/1110: Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)