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Study of oxide precipitates in silicon using X-ray diffraction techniques

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F11%3A00050295" target="_blank" >RIV/00216224:14740/11:00050295 - isvavai.cz</a>

  • Alternative codes found

    RIV/68081723:_____/11:00371107

  • Result on the web

    <a href="http://dx.doi.org/10.1002/pssa.201184263" target="_blank" >http://dx.doi.org/10.1002/pssa.201184263</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/pssa.201184263" target="_blank" >10.1002/pssa.201184263</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Study of oxide precipitates in silicon using X-ray diffraction techniques

  • Original language description

    The results of a study of oxide precipitates in Czochralski (CZ) grown silicon using two X-ray diffraction methods are reported. The diffuse scattering around the Bragg diffraction maxima was measured on a series of samples after various two-stage annealing treatment. Combining the analysis of diffuse scattering with other experimental techniques we were able to determine mean precipitate size and deformation field around the precipitates. The obtained data show that the deformation field is proportional to the precipitate volume and independent on the annealing temperature or annealing time. The dynamical diffraction in Laue geometry was used to measure precipitate concentration. The results are compared to the selective etching concentration measurement.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    physica status solidi (a), Applied research

  • ISSN

    1862-6300

  • e-ISSN

  • Volume of the periodical

    208

  • Issue of the periodical within the volume

    11

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    4

  • Pages from-to

    2587-2590

  • UT code for WoS article

    000297514200018

  • EID of the result in the Scopus database